LECO CORPORATION

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AXS:

Interactive, Real Time, X-Ray Spectrometry AXS is an Automated X-Ray Spectrometer system that interactively provides— Simplicity & Speed for Routine Analysis because "Run" button control for start up is all that's needed to begin interactive, simultaneous, acquisition & processing of data. Flexibility for Research because there is instantaneous choice & control of analytical parameters (kV, mA, Crystals, Collimators, Filters, Detector, Data Reduction Model, Goniometer Setting, etc.) Extensive, Instantaneous Choice of Software because the large virtual memory stores as many as 200 analytical jobs. Unique, Rapid, Qualitative Analysis because interaction between hardware and data collection software allows variable scanning rates to reduce analysis time to 20 minutes. . . . and, of course, multi-position sample loading (4, 12, or 60 position) together with the precision, reliability and quality you expect from a Philips wavelength X-ray spectrometer.

Philips Electronic Instruments, Inc. 85 McKee Drive · Mahwah, N.J. 07430

Circle Reader No. 170

201 529-3800 A North American Philips Company

More Science

I hick Specimen root Κ,ΟΟΟχ

Section of 2 micron (hick, castor oil plant

Rocking B e a m Transmission Channeling Patte From 4-Onin area in Silicon.

Primary Electron Backscatter Escherichia coli. STEM Convergent B e a m Zone Axis Pattern Silicon foil in S EM mode. 15,000.x (Made on EM301 STEM)

4-Oiim area selected by focussed beam. (Courtcsv o l d . Racklur & .1. Steeds, Depl. of Physics, Bristol I'nivcrsitv, England.

5 reasons why: 1. The cleanest imaging system of any electron microscope . . . (STEM 4()0's ion pumped column gives a true 1() 7 specimen vacuum) allows practical use of the small diameter, intense beam required by STEM. 2. STEM 4()()'s intense small diameter beam is practical because the 1() 7 specimen area vacuum virtually elinnnates etching and contamination in the specimen environment. 3. The significant reduction in cliromatic aberration of the 4 lens magnifica­ tion system permits extension of specimen selection to include extremclv thick specimens, to 2μ thick. 4. Digital electronics permits instant changeover from STEM to TEM nuxle & vice versa. 5. Automation of routine operations allow unprecedented speed in specimen area selection, locus and observation. Philips Electronic Instruments, Inc. 85 McKee Drive Mahwah, X. •). 074-30 Λ Xort))/\mcrira]] Philips Company

Circle R e a d e r Xo. 171